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Advances in synchrotron radiation sources have opened up a new frontier of inelastic X-ray scattering (IXS) spectroscopy. The IXS measurements with a resolution much better than a few eV are now becoming feasible. Such experiments can be used to study various properties of condensed systems: e.g., electron correlations in the ground state (Compton-Raman scattering), eV and sub-eV electronic excitations (X-ray Raman scattering and small-angle IXS), and meV phonon excitations (ultra-high resolution IXS) .
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This page is a summary of: Recent Developments of Inelastic X-ray Scattering Spectroscopy., Nihon Kessho Gakkaishi, January 1998, The Crystallographic Society of Japan,
DOI: 10.5940/jcrsj.40.177.
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