What is it about?
A review focusing on the most significant and essential progress in X-ray spectrometry (XRS) published during the period 2006-2007. It covers the following topics: developments and improvements in the detection performance and instrumentation of X-ray techniques and X-ray optics, new quantification models in X-ray spectra and data evaluation, micro-X-ray fluorescence including 3D-XRF, imaging techniques such as tomography and holography methods for 2D or 3D imaging of microstructures, electron probe microanalysis (EPMA), total reflection X-ray fluorescence (TXRF), particle-induced X-ray emission (PIXE) analysis, and X-ray absorption spectrometry (XAS).
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This page is a summary of: X-ray Spectrometry, Analytical Chemistry, June 2008, American Chemical Society (ACS),
DOI: 10.1021/ac800678s.
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