Obtaining atom concentration, absolute specimen thickness, especially the local ones.

What is it about?

The described two techniques are about getting, from some materials, important information about the density and other parameters such as Fermi energy, plasmon mean free path, specimen thickness etc. and may be found to be very useful (1) in studying very small volumes of matter with, for instance, the aim of getting density-property relationships, (2) in comparative studies of, for instance, very small (e.g. nanosized) features present within the same microscope specimen ...

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Why is it important?

The (local or average) specimen thickness is obtainable using EELS only. Therefore the optical refractive index is not necessary for obtaining this important parameter.