Software for X-ray reflectivity simulation and curve fitting

What is it about?

This article introduces X-Ray Calc (XRC). This free software program helps scientists simulate X-ray reflectivity (XRR) and solve the problem of figuring out the structure of thin films based on XRR measurements. XRC has an easy-to-use visual interface that allows users to simulate and reconstruct film structures interactively. The software uses a special method based on the Fresnel equations to calculate XRR and includes tools for modeling complex multilayer structures. The latest version, XRC3, has some exciting new features. It can automatically fit XRR curves using a special optimization algorithm and a new cost function designed for periodic structures. The software also has a new, simpler interface to make it easier for users.

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Why is it important?

Understanding the structure of thin films is crucial in various scientific fields, such as materials science, nanotechnology, and surface chemistry. X-ray reflectivity (XRR) is a powerful technique to study these structures.

Perspectives

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This paper represents a significant advancement in X-ray reflectivity analysis. It offers researchers a powerful tool to enhance their studies and drive innovation in various scientific disciplines.

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