Time-resolved high-energy X-ray diffraction studies of ultrathin Ni ferrite films on MgO(001)

What is it about?

Time-resolved high-energy X-ray diffraction was used during growth of ultrathin NixFe3−xO4 films of varying Ni content (0 ≤ x ≤ 1.5) on MgO(001). For low Ni contents (x ≤ 1), the films grow initially in a rock salt phase followed by an inverse spinel structure, while overstoichiometric films (Ni contents x > 1) grow completely in a rock salt structure.

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