What is it about?
We predicted that an X-ray interferometer detects the displacement field of the surface of a bent crystal. We report on the experimental confirmation of this prediction by the phase-contrast topography.
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Why is it important?
The measured value of the bulk lattice parameter of 28Si using X-ray interferometry is essential to realize the kilogram by counting 28Si atoms. An analytical study of the X-ray propagation in bent crystals predicts that the measured lattice spacing refers instead to the crystal surface. We confirm experimentally this prediction.
Perspectives
Our results support experimentally the dynamical theory of X-ray propagation in crystals and more accurate measurements of the Si lattice parameter.
Dr Giovanni Mana
Istituto Nazionale di Ricerca Metrologica
Read the Original
This page is a summary of: Crystal bending in triple-Laue X-ray interferometry. Part II. Phase-contrast topography, Journal of Applied Crystallography, May 2023, International Union of Crystallography,
DOI: 10.1107/s1600576723002832.
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