Using X-ray diffraction to calculate strain distributions within crystals

What is it about?

The atomic arrangement within a crystal can be characterized using X-ray diffraction. We have developed a framework for analyzing strain variation within crystals, targeted at scanning X-ray diffraction experiments.

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Why is it important?

Previous methods for strain reconstruction on an intragranular level results in dampening artifacts. By respecting the tomographic nature of the inverse problem of strain retrieval, our work helps increase accuracy of the reconstructed strain tensor maps.

Perspectives

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It is my hope that the work outlined in this article will be of help in the development of experimental setups and ultimately to the broader field of materials science.

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