Publication
Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, P R Edwards, G Ferenczi, B Hourahine, A Kotzai, S Kraeusel, G Kusch, R W Martin, R McDermott, G Naresh-Kumar, M Nouf-Allehiani, E Pascal, D Thomson, S Vespucci, M D Smith, P J Parbrook, J Enslin, F Mehnke, C Kuhn, T Wernicke, M Kneissl, S Hagedorn, A Knauer, S Walde, M Weyers, P-M Coulon, P A Shields, J Bai, Y Gong, L Jiu, Y Zhang, R M Smith, T Wang, A Winkelmann
Semiconductor Science and Technology, March 2020, Institute of Physics Publishing
DOI: 10.1088/1361-6641/ab75a5