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  1. Impact of 100 keV proton irradiation on electronic and optical properties of AlGaN/GaN high electron mobility transistors (HEMTs)
  2. Borosilicate Glass (BSG) as Gate Dielectric for 4H-SiC MOSFETs
  3. Stable Phosphorus Passivated SiO2/4H-SiC Interface Using Thin Oxides