All Stories

  1. Special Section Guest Editorial: Interferometry

    Article • Optical Engineering, September 2017, SPIE

    Dr. Peter J de Groot

  2. Measurement, certification and use of step-height calibration specimens in optical metrology

    Article • June 2017, SPIE

    Dr. Peter J de Groot

  3. The Meaning and Measure of Vertical Resolution in Optical Surface Topography Measurement

    Article • Applied Sciences, January 2017, MDPI AG

    Dr. Peter J de Groot

  4. Using the Instrument Transfer Function to Evaluate Fizeau Interferometer Performance

    Article • January 2017, Optical Society of America (OSA)

    Dr. Peter J de Groot

  5. Interference microscope objectives for wide-field areal surface topography measurements

    Article • Optical Engineering, July 2016, SPIE

    Dr. Peter J de Groot

  6. Holography: Just a Fancy Word for Interferometry?

    Article • January 2016, Optical Society of America (OSA)

    Dr. Peter J de Groot

  7. Advances in Optical Metrology

    Article • September 2015, Wiley

    Dr. Peter J de Groot

  8. A new class of wide-field objectives for 3D interference microscopy

    Article • June 2015, SPIE

    Dr. Peter J de Groot

  9. Interference Microscopy for Surface Structure Analysis

    Article • April 2015, Taylor & Francis

    Dr. Peter J de Groot

  10. Principles of interference microscopy for the measurement of surface topography

    Article • Advances in Optics and Photonics, February 2015, Optical Society of America (OSA)

    Dr. Peter J de Groot

  11. Correlated errors in phase-shifting laser Fizeau interferometry

    Article • Applied Optics, June 2014, Optical Society of America (OSA)

    Dr. Peter J de Groot

  12. Measuring High-Slope and Super-Smooth Optics with High-Dynamic-Range Coherence Scanning Interferometry

    Article • January 2014, Optical Society of America (OSA)

    Dr. Peter J de Groot

  13. Interferometric methods of 3D surface structure analysis

    Article • August 2012, Institute of Electrical & Electronics Engineers (IEEE)

    Dr. Peter J de Groot

  14. Lateral resolution and instrument transfer function as criteria for selecting surface metrology instruments

    Article • January 2012, Optical Society of America (OSA)

    Dr. Peter J de Groot

  15. Coherence Scanning Interferometry

    Article • January 2011, Springer Science + Business Media

    Dr. Peter J de Groot

  16. Phase Shifting Interferometry

    Article • January 2011, Springer Science + Business Media

    Dr. Peter J de Groot

  17. Instantaneous Interferometry: Another View

    Article • January 2010, Optical Society of America (OSA)

    Dr. Peter J de Groot

  18. Design of error-compensating algorithms for sinusoidal phase shifting interferometry

    Article • Applied Optics, December 2009, Optical Society of America (OSA)

    Dr. Peter J de Groot

  19. Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures

    Article • January 2009, Springer Science + Business Media

    Dr. Peter J de Groot

  20. Transparent film profiling and analysis by interference microscopy

    Article • August 2008, SPIE

    Dr. Peter J de Groot

  21. Metrology of optically-unresolved features using interferometric surface profiling and RCWA modeling

    Article • Optics Express, March 2008, Optical Society of America (OSA)

    Dr. Peter J de Groot

  22. Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry

    Article • Optics Letters, June 2007, Optical Society of America (OSA)

    Dr. Peter J de Groot

  23. Stroboscopic white-light interference microscopy

    Article • Applied Optics, August 2006, Optical Society of America (OSA)

    Dr. Peter J de Groot

  24. Interpreting interferometric height measurements using the instrument transfer function

    Article • January 2006, Springer Science + Business Media

    Dr. Peter J de Groot

  25. Generating fringe-free images from phase-shifted interferometry data

    Article • Applied Optics, November 2005, Optical Society of America (OSA)

    Dr. Peter J de Groot

  26. Optical Metrology

    Article • October 2004, Wiley

    Dr. Peter J de Groot

  27. Signal modeling for modern interference microscopes

    Article • September 2004, SPIE

    Dr. Peter J de Groot

  28. Signal modeling for low-coherence height-scanning interference microscopy

    Article • Applied Optics, September 2004, Optical Society of America (OSA)

    Dr. Peter J de Groot

  29. Surface profiling using a reference-scanning Mirau interference microscope

    Article • August 2004, SPIE

    Dr. Peter J de Groot

  30. Valve cone measurement using white light interference microscopy in a spherical measurement geometry

    Article • Optical Engineering, May 2003, SPIE

    Dr. Peter J de Groot

  31. Determination of fringe order in white-light interference microscopy

    Article • Applied Optics, August 2002, Optical Society of America (OSA)

    Dr. Peter J de Groot

  32. Optical interferometry for measurement of the geometric dimensions of industrial parts

    Article • Applied Optics, July 2002, Optical Society of America (OSA)

    Dr. Peter J de Groot

  33. Step height measurements using a combination of a laser displacement gage and a broadband interferometric surface profiler

    Article • June 2002, SPIE

    Dr. Peter J de Groot

  34. Unusual techniques for absolute distance measurement

    Article • Optical Engineering, January 2001, SPIE

    Dr. Peter J de Groot

  35. Measurement of transparent plates with wavelength-tuned phase-shifting interferometry

    Article • Applied Optics, June 2000, Optical Society of America (OSA)

    Dr. Peter J de Groot

  36. Diffractive grazing-incidence interferometer

    Article • Applied Optics, April 2000, Optical Society of America (OSA)

    Dr. Peter J de Groot

  37. Wavelength-tuned phase shifting interferometry applied to the measurement of transparent plates

    Article • January 2000, Optical Society of America (OSA)

    Dr. Peter J de Groot

  38. Geometrically desensitized interferometry for shape measurement of flat surfaces and 3-D structures

    Article • Optical Engineering, January 2000, SPIE

    Dr. Peter J de Groot

  39. Optical properties of alumina titanium carbide sliders used in rigid disk drives

    Article • Applied Optics, October 1998, Optical Society of America (OSA)

    Dr. Peter J de Groot

  40. Adjustable coherence depth in a geometrically desensitized interferometer

    Article • July 1998, SPIE

    Dr. Peter J de Groot

  41. Interferometric analysis of stress-induced birefringence in a rotating glass disk

    Article • June 1998, SPIE

    Dr. Peter J de Groot

  42. Birefringence in rapidly rotating glass disks

    Article • Journal of the Optical Society of America A, May 1998, Optical Society of America (OSA)

    Dr. Peter J de Groot

  43. Punctuated quadrature phase-shifting interferometry

    Article • Optics Letters, January 1998, Optical Society of America (OSA)

    Dr. Peter J de Groot

  44. 101-frame algorithm for phase-shifting interferometry

    Article • September 1997, SPIE

    Dr. Peter J de Groot

  45. Equivalent wavelength interferometry using diffractive optics

    Article • September 1996, SPIE

    Dr. Peter J de Groot

  46. Optical flying-height testing of magnetic read-write heads

    Article • September 1996, SPIE

    Dr. Peter J de Groot

  47. Numerical simulations of vibration in phase-shifting interferometry

    Article • Applied Optics, May 1996, Optical Society of America (OSA)

    Dr. Peter J de Groot

  48. Grating interferometer for flatness testing

    Article • Optics Letters, February 1996, Optical Society of America (OSA)

    Dr. Peter J de Groot

  49. Novel Interferometer Based on a Wedge Prism

    Article • Applied Optics, December 1995, Optical Society of America (OSA)

    Dr. Peter J de Groot

  50. Vibration in phase-shifting interferometry: errata

    Article • Journal of the Optical Society of America A, October 1995, Optical Society of America (OSA)

    Dr. Peter J de Groot

  51. Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window

    Article • Applied Optics, August 1995, Optical Society of America (OSA)

    Dr. Peter J de Groot

  52. Phase-shift calibration errors in interferometers with spherical Fizeau cavities

    Article • Applied Optics, June 1995, Optical Society of America (OSA)

    Dr. Peter J de Groot

  53. Vibration in phase-shifting interferometry

    Article • Journal of the Optical Society of America A, February 1995, Optical Society of America (OSA)

    Dr. Peter J de Groot

  54. High-speed noncontact profiler based on scanning white-light interferometry

    Article • Applied Optics, November 1994, Optical Society of America (OSA)

    Dr. Peter J de Groot

  55. Extending the unambiguous range of two-color interferometers

    Article • Applied Optics, September 1994, Optical Society of America (OSA)

    Dr. Peter J de Groot

  56. Fiber-coupled Laser Diode Mount for Interferometry

    Article • Applied Optics, December 1993, Optical Society of America (OSA)

    Dr. Peter J de Groot

  57. Three-dimensional imaging by sub-Nyquist sampling of white-light interferograms

    Article • Optics Letters, September 1993, Optical Society of America (OSA)

    Dr. Peter J de Groot

  58. Use of a multimode short-external-cavity laser diode for absolute-distance interferometry

    Article • Applied Optics, August 1993, Optical Society of America (OSA)

    Dr. Peter J de Groot

  59. Laser gage using chirped synthetic wavelength interferometry

    Article • May 1993, SPIE

    Dr. Peter J de Groot

  60. Chirped synthetic-wavelength interferometry

    Article • Optics Letters, November 1992, Optical Society of America (OSA)

    Dr. Peter J de Groot

  61. Chromatic dispersion effects in coherent absolute ranging

    Article • Optics Letters, June 1992, Optical Society of America (OSA)

    Dr. Peter J de Groot

  62. Synthetic wavelength stabilization for two-color laser-diode interferometry

    Article • Applied Optics, October 1991, Optical Society of America (OSA)

    Dr. Peter J de Groot

  63. Three-color laser-diode interferometer

    Article • Applied Optics, September 1991, Optical Society of America (OSA)

    Dr. Peter J de Groot

  64. Interferometric laser profilometer for rough surfaces

    Article • Optics Letters, March 1991, Optical Society of America (OSA)

    Dr. Peter J de Groot

  65. Laser diode technologies for in-process metrology

    Article • November 1990, SPIE

    Dr. Peter J de Groot

  66. Laser diode backscatter modulation for machine vision

    Article • October 1990, SPIE

    Dr. Peter J de Groot

  67. Applications of optical feedback in laser diodes

    Article • May 1990, SPIE

    Dr. Peter J de Groot

  68. Optical Testing Using Laser Feedback Metrology

    Article • April 1990, SPIE

    Dr. Peter J de Groot

  69. Adaptive neural network in a hybrid optical/electronic architecture using lateral inhibition

    Article • Applied Optics, September 1989, Optical Society of America (OSA)

    Dr. Peter J de Groot

  70. Backscatter-Modulation Semiconductor Laser Radar

    Article • September 1989, SPIE

    Dr. Peter J de Groot, Chandrasekhar Roychoudhuri

  71. Laser feedback metrology of optical systems

    Article • Applied Optics, July 1989, Optical Society of America (OSA)

    Dr. Peter J de Groot

  72. Reconfigurable bipolar analog optical crossbar switch

    Article • Applied Optics, April 1989, Optical Society of America (OSA)

    Dr. Peter J de Groot

  73. Three-Dimensional Imaging Coherent Laser Radar Array

    Article • Optical Engineering, April 1989, SPIE

    Dr. Peter J de Groot

  74. Compact Imaging System With Ranging And Velocimetry

    Article • March 1989, SPIE

    Dr. Peter J de Groot

  75. Backscatter-modulation velocimetry with an external-cavity laser diode

    Article • Optics Letters, January 1989, Optical Society of America (OSA)

    Dr. Peter J de Groot