All Stories

  1. Deposition and etching behaviour of boron trichloride gas at silicon surface
  2. High Temperature SiC Reactor Cleaning Using Chlorine Trifluoride Gas Achieved by Purified Pyrolytic Carbon Coating Film
  3. Chlorine Trifluoride Gas Distributor Design for Single-Crystalline C-Face 4H-Silicon Carbide Wafer Etcher
  4. Exposure of Tantalum Carbide, Silicon Nitride and Aluminum Nitride to Chlorine Trifluoride Gas
  5. High-Temperature Reactor Cleaning Using Chlorine Trifluoride Gas for Silicon Carbide Chemical Vapor Deposition
  6. Influence of Metal and Polymer Substrate on SiCxNyOz Film Formation by Non-Heat Assistance Plasma-Enhanced Chemical Vapor Deposition Using Monomethylsilane, Nitrogen and Argon Gases
  7. Silicon epitaxial growth accelerated by parallel Langmuir processes using SiH2Cl2 and SiH3CH3 gases
  8. 4H-Silicon Carbide Wafer Surface after Chlorine Trifluoride Gas Etching
  9. Water Outlet Design of Wet Cleaning Bath for 300-mm Diameter Silicon Wafers
  10. Susceptor Coating Materials Applicable for SiC Reactor Cleaning
  11. Mirror Etching of Single Crystalline C-Face 4H-Silicon Carbide Wafer by Chlorine Trifluoride Gas
  12. Non-Heat Assistance Plasma-Enhanced Chemical Vapor Deposition of SiCxNyOzFilm Using Monomethylsilane, Nitrogen and Argon
  13. Quick Cleaning Process for Silicon Carbide Chemical Vapor Deposition Reactor
  14. In Situ Cleaning Process of Silicon Carbide Epitaxial Reactor for Removing Film-Type Deposition Formed on Susceptor
  15. Etching Rate Behavior of 4H-Silicon Carbide Epitaxial Film Using Chlorine Trifluoride Gas
  16. Non-heat assistance chemical vapor deposition of amorphous silicon carbide using monomethylsilane gas under argon plasma
  17. Cleaning Process for Using Chlorine Trifluoride Gas Silicon Carbide Chemical Vapor Deposition Reactor
  18. Chlorine Trifluoride Gas Transport and Etching Rate Distribution in Silicon Carbide Dry Etcher
  19. Surface and gas phase reactions induced in a trichlorosilane–SiH x system for silicon film deposition
  20. Low temperature amorphous silicon carbide thin film formation process on aluminum surface using monomethylsilane gas and trichlorosilane gas
  21. Precipitates formed in silicon wafers by prolonged high-temperature annealing in nitrogen atmosphere
  22. Development of Silicon Carbide Dry Etcher Using Chlorine Trifluoride Gas
  23. Off-Orientation Influence on C-Face (0001) 4H-SiC Surface Morphology Produced by Etching Using Chlorine Trifluoride Gas
  24. Cleaning Process Applicable to Silicon Carbide Chemical Vapor Deposition Reactor
  25. Langasite crystal microbalance frequency behavior over wide gas phase conditions for chemical vapor deposition
  26. Numerical Calculation Model of Single Wafer Wet Etcher Using Swinging Nozzle
  27. Precipitates caused by prolonged high-temperature annealing in floating zone silicon wafer grown from Czochralski single-crystal rod
  28. Crystalline Defects in Silicon Wafer Caused by Prolonged High-Temperature Annealing in Nitrogen Atmosphere
  29. Chemical vapor deposition of amorphous silicon carbide thin films on metal surfaces using monomethylsilane gas at low temperatures
  30. Amorphous Silicon Carbide Film Formation at Room Temperature by Monomethylsilane Gas
  31. Off-Orientation Influence on C-Face (0001) 4H-SiC Surface Morphology Produced by Etching Using Chlorine Trifluoride Gas
  32. Silicon Chemical Vapor Deposition Process Using a Half-Inch Silicon Wafer for Minimal Manufacturing System
  33. Surface Chemical Reaction Model of Silicon Dioxide Film Etching by Dilute Hydrogen Fluoride Using a Single Wafer Wet Etcher
  34. Numerical calculation model of a single wafer wet etcher using a swinging nozzle
  35. Density of Etch Pits on C-Face 4H-SiC Surface Produced by ClF3 Gas
  36. Density and Behavior of Etch Pits on C-Face 4H-SiC Surface Produced by CIF3 Gas
  37. Concentration of Three Organic Compounds Influencing each other on Silicon Surface
  38. Silicon Epitaxial Growth Rate and Transport Phenomena in a Vertical Stacked-Type Multi-Wafer Reactor
  39. Langasite Crystal Microbalance Used for In-Situ Monitoring of Amorphous Silicon Carbide Film Deposition
  40. Room Temperature Process for Chemical Vapor Deposition of Amorphous Silicon Carbide Thin Film Using Monomethylsilane Gas
  41. Room temperature process for chemical vapor deposition of amorphous silicon carbide thin film using monomethylsilane gas
  42. Langasite Crystal Microbalance for Development of Reactive Surface Preparation of Silicon Carbide Film Deposition from Monomethylsilane Gas
  43. Low Temperature SiC Film Deposition Using Trichlorosilane Gas and Monomethylsilane Gas
  44. Silicon epitaxial growth process using trichlorosilane gas in a single-wafer high-speed substrate rotation reactor
  45. Etch Pits on 4H-SiC Surface Produced by ClF3 Gas
  46. Silicon Surface Morphology after Annealing in Ambient Hydrogen Containing a Trace Amount of Hydrogen Halide Gas
  47. Advance of Atomic Layer Deposition in Semiconductor Materials Manufacturing Process: Cleaning Technology for Thin Film Formation Reactor
  48. Mechanism of Silicon Carbide Film Deposition at Room Temperature Using Monomethylsilane Gas
  49. Water Motion over a Wafer Surface Rotating in a Single-Wafer Wet Cleaner
  50. Water Motion over a Wafer Surface Rotating in a Single-Water Wet Cleaner
  51. 4H-SiC Surface Morphology Etched Using ClF3 Gas
  52. Dominant Forces for Driving Bubbles in a Wet Cleaning Bath Using Megasonic Wave
  53. Molecular Interaction Radii and Rate Constants for Clarifying Organic Compound Physisorption on Silicon Surface
  54. Silicon carbide film deposition at low temperatures using monomethylsilane gas
  55. Hafnium Oxide Film Etching Using Hydrogen Chloride Gas
  56. Etching Rate of Silicon Dioxide Using Chlorine Trifluoride Gas
  57. Atomospheric Pressure SiC Film Deposition at Low Temperatures Using SiH
  58. Hafnium Oxide Etching Using Hydrogen Chloride Gas
  59. Temperature-Dependent Behavior of 4H-Silicon Carbide Surface Morphology Etched Using Chlorine Trifluoride Gas
  60. Water and Bubble Motions Under Megasonic Wave in a Silicon Wafer Wet Cleaning Bath
  61. Heat Transport and Temperature Gradient in Silicon-on-Insulator Wafer during Flash Lamp Annealing Process
  62. Decarbonation and Pore Structural Change of Ca-Solid Reactant for CaO/CO2 Chemical Heat Pump
  63. Etching Rate Behavior of 4H-Silicon Carbide Using Chlorine Trifloride Gas
  64. Heat Transport Analysis for Flash Lamp Annealing
  65. Polycrystalline silicon carbide film deposition using monomethylsilane and hydrogen chloride gases
  66. Water Motion in a Water Curtain Head for Cleaning a Large Glass Plate
  67. Carbonation/Decarbonation of Ca-Solid Reactant Derived from Natural Limestone for Thermal-Energy Storage and Temperature Upgrade
  68. In-Situ Measurement Method and Rate Theory for Clarifying Multi-Component Organic Compounds Adsorption and Desorption on Silicon Surface
  69. Physisorption and Desorption of Diethyl Phthalate and Isopropanol on a Silicon Surface
  70. Small-Batch Reactor Development for Silicon Epitaxial Film Growth Based on Theory of Transport Phenomena
  71. Etch rate and surface morphology of polycrystalline β-silicon carbide using chlorine trifluoride gas
  72. Air Flow in Square Quartz Plate Spin Cleaner
  73. Dominant rate process of silicon surface etching by hydrogen chloride gas
  74. Highly Concentrated Ozone Gas for Preparing Wettable Polyimide Surface
  75. Silicon Carbide Etching Using Chlorine Trifluoride Gas
  76. Quartz Crystal Microbalance for Silicon Surface Organic Contamination
  77. Gas Velocity Influence on Silicon Surface Organic Contamination Evaluated Using Quartz Crystal Microbalance
  78. Heat Balance Evaluation for Rapid Thermal Processing System Design
  79. Formation mechanism of local thickness profile of silicon epitaxial film
  80. Silicon Etch Rate Using Chlorine Trifluoride
  81. Water Motion in Carrierless Wet Station
  82. Airborne Organic Contamination Behavior on Silicon Wafer Surface
  83. High-Performance Silicon Etching Using Chlorine Trifluoride Gas
  84. Hot-wall and cold-wall environments for silicon epitaxial film growth
  85. Adsorption and Desorption Rate of Multicomponent Organic Species on Silicon Wafer Surface
  86. Design of a Rapid Thermal Processing System Using a Reflection-Resolved Ray Tracing Method
  87. Development of Evaluation Method for Organic Contamination on Silicon Wafer Surfaces
  88. Model of boron incorporation into silicon epitaxial film in a B2H6–SiHCl3–H2 system
  89. Instability of diborane gas in silicon epitaxial film growth
  90. Rate Theory of Multicomponent Adsorption of Organic Species on Silicon Wafer Surface
  91. Thermal Conditions in Rapid Thermal Processing System Using Circular Infrared Lamp
  92. Chemical process of silicon epitaxial growth in a SiHCl3–H2 system
  93. Model on transport phenomena and epitaxial growth of silicon thin film in SiHCl3H2 system under atmospheric pressure