All Stories

  1. Fabrication and Characterization of Ohmic Contacts to 3C-SiC Layers Grown on Silicon

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    Dr Marcin Zielinski, Francesco La Via

  2. Vapor Growth of 3C-SiC Using the Transition Layer of 3C-SiC on Si CVD Templates

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    dr marco mauceri, Francesco La Via, Dr Marcin Zielinski

  3. High Resolution Investigation of Stacking Fault Density by HRXRD and STEM

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    dr marco mauceri, Francesco La Via

  4. Thermal Annealing of High Dose P Implantation in 4H-SiC

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    Francesco La Via, Cristiano Calabretta

  5. High Quality 4H-SiC Epitaxial Layer by Tuning CVD Process

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    Francesco La Via

  6. Electrical Properties of Thermal Oxide on 3C-SiC Layers Grown on Silicon

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    Dr Marcin Zielinski, Francesco La Via

  7. Electrical Characterisation of Thick 3C-SiC Layers Grown on Off-Axis 4H-SiC Substrates

    Article • Materials Science Forum, July 2019, Trans Tech Publications

    Dr YOGESH SHARMA, Francesco La Via

  8. Growth of 4H-SiC Epitaxial Layer through Optimization of Buffer Layer

    Article • Materials Science Forum, June 2018, Trans Tech Publications

    Francesco La Via

  9. Stress Relaxation Mechanism after Thinning Process on 4H-SiC Substrate

    Article • Materials Science Forum, June 2018, Trans Tech Publications

    Francesco La Via

  10. Stacking Faults Defects on 3C-SiC Homo-Epitaxial Films

    Article • Materials Science Forum, June 2018, Trans Tech Publications

    Francesco La Via

  11. 3C-SiС Hetero-Epitaxially Grown on Silicon Compliance Substrates and New 3C-SiС Substrates for Sustainable Wide-Band-Gap Power Devices (CHALLENGE)

    Article • Materials Science Forum, June 2018, Trans Tech Publications

    Francesco La Via, dr Roberta Nipoti, Dr Marcin Zielinski, Adolf Schöner, gregory grosset

  12. Double Step Annealing for the Recovering of Ion Implantation Defectiveness in 4H-SiC DIMOSFET

    Article • Materials Science Forum, June 2018, Trans Tech Publications

    dr Roberta Nipoti, Francesco La Via

  13. 4H-SiC Defects Evolution by Thermal Processes

    Article • Materials Science Forum, May 2017, Trans Tech Publications

    Francesco La Via

  14. Detection of Crystallographic Defects in 3C-SiC by Micro-Raman and Micro-PL Analysis

    Article • Materials Science Forum, May 2017, Trans Tech Publications

    Francesco La Via

  15. 3C-SiC Bulk Sublimation Growth on CVD Hetero-Epitaxial Seeding Layers

    Article • Materials Science Forum, May 2017, Trans Tech Publications

    dr marco mauceri, Francesco La Via

  16. Hydrogen Flux Influence on Homo-Epitaxial 4H-SiC Doping Concentration Profile for High Power Application

    Article • Materials Science Forum, May 2016, Trans Tech Publications

    Francesco La Via

  17. Voids-Free 3C-SiC/Si Interface for High Quality Epitaxial Layer

    Article • Materials Science Forum, May 2016, Trans Tech Publications

    Francesco La Via

  18. Electrical Properties of Defects in 4H-SiC Investigated by Photo-Induced-Currents Measurements

    Article • Materials Science Forum, May 2016, Trans Tech Publications

    Francesco La Via

  19. Physical Vapor Growth of Double Position Boundary Free, Quasi-Bulk 3C-SiC on High Quality 3C-SiC on Si CVD Templates

    Article • Materials Science Forum, May 2016, Trans Tech Publications

    Francesco La Via, dr marco mauceri

  20. Stacking Fault Analysis of Epitaxial 3C-SiC on Si(001) Ridges

    Article • Materials Science Forum, May 2016, Trans Tech Publications

    dr marco mauceri, Francesco La Via

  21. 3C-SiC Epitaxy on Deeply Patterned Si(111) Substrates

    Article • Materials Science Forum, May 2016, Trans Tech Publications

    dr marco mauceri, Francesco La Via, Adolf Schöner

  22. Ion Implantation Defects in 4H-SiC DIMOSFET

    Article • Materials Science Forum, May 2016, Trans Tech Publications

    Francesco La Via

  23. Advanced Silicon Carbide Devices and Processing

    Article • September 2015, IntechOpen

    Francesco La Via

  24. Epitaxial Growth on 150 mm 2° off Wafers

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    dr marco mauceri, Francesco La Via

  25. 3C-SiC Polycrystalline Films on Si for Photovoltaic Applications

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    Francesco La Via

  26. Defect Reduction in Epitaxial 3C-SiC on Si(001) and Si(111) by Deep Substrate Patterning

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    dr marco mauceri, Francesco La Via

  27. Monte Carlo Study of the early Growth Stages of 3C-SiC on Misoriented <11-20> and <1-100> 6H-SiC Substrates: Role of Step-Island Interaction

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    Francesco La Via

  28. Correlations between Crystal Quality and Electrical Properties by Means of Simultaneous Photoluminescence and Photocurrent Analysis

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    Francesco La Via

  29. 4H-SiC Defects Analysis by Micro Raman Spectroscopy

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    Francesco La Via

  30. Electrical Properties Evaluation on High Quality Hetero-Epitaxial 3C-SiC(001) for MOSFET Applications

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    Francesco La Via

  31. Hetero-Epitaxial Single Crystal 3C-SiC Opto-Mechanical Pressure Sensor

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    dr Roberta Nipoti, Francesco La Via

  32. Strain Evaluation and Fracture Properties of Hetero-Epitaxial Single Crystal 3C-SiC Squared Membrane

    Article • Materials Science Forum, October 2014, Trans Tech Publications

    Francesco La Via

  33. Analysis on 3C-SiC Layer Grown on Pseudomorphic-Si/Si1-xGex/Si(001) Heterostructures

    Article • Materials Science Forum, October 2014, Trans Tech Publications

    Francesco La Via

  34. Micro-Raman Characterization of 4H-SiC Stacking Faults

    Article • Materials Science Forum, February 2014, Trans Tech Publications

    Francesco La Via

  35. Structural Characterization of Heteroepitaxial 3C-SiC

    Article • Materials Science Forum, January 2012, Trans Tech Publications

    Francesco La Via

  36. (Invited) High Quality 3C-SiC for MOS Applications

    Article • January 2011, The Electrochemical Society

    Francesco La Via

  37. High Power Density UV Optical Stress for Quality Evaluation of 4H-SiC Epitaxial Layers

    Article • January 2011, The Electrochemical Society

    Francesco La Via

  38. Single Shockley Faults Enlargement during Micro-Photoluminescence Defects Mapping

    Article • Materials Science Forum, April 2010, Trans Tech Publications

    Francesco La Via

  39. Single Shockley Faults Evolution Under UV Optical Pumping

    Article • MRS Proceedings, January 2010, Cambridge University Press

    Francesco La Via

  40. Comparison between Different Schottky Diode Edge Termination Structures: Simulations and Experimental Results

    Article • Materials Science Forum, January 2003, Trans Tech Publications

    Francesco La Via

  41. Investigation on C54 nucleation and growth by micro-Raman imaging

    Article • MRS Proceedings, January 2000, Cambridge University Press

    Francesco La Via