What is it about?
In this paper, a low‑noise transimpedance amplifier for pixelated CMOS photon detector for the use in the scanning electron microscope is presented.
Featured Image
Photo by Christian Wiediger on Unsplash
Why is it important?
The TIA was proven experimentally to work at a frequency in excess of 3.5 MHz and produce a transimpedance gain of 127.68 dBΩ.
Perspectives
A good design of CMOS TIA for use in an integrated circuit for the scanning electron microscope.
Dr Joon Huang Chuah
University of Malaya
Read the Original
This page is a summary of: Low-noise transimpedance amplifier for pixelated CMOS photon detector in the scanning electron microscope, IETE Journal of Research, January 2013, Medknow,
DOI: 10.4103/0377-2063.116082.
You can read the full text:
Resources
Contributors
The following have contributed to this page
