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Finding the optical constants and the band gap of atomic layer deposited Cr2O3 films using the spectral ellipsometric and spectrophotometric data over a set of films with different thicknesses.

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This page is a summary of: Dispersion of chromia films (eskolaite) in UV-VIS, December 2019, De Gruyter,
DOI: 10.2478/jee-2019-0039.
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