Publication
Deleterious Variants Contribute Minimal Excess Risk in Large-Scale Testing
Pui-Yan Kwok, En-Yu Lai, Jia-Ying Su, Hsueh-Ju Lu, Yen-Lin Chen, Jer-Yuarn Wu, Chun-yu Wei, Ling-Hui Li, Cathy S.-J. Fann, Hsin-Chou Yang, Chien-Hsiun Chen, Hung-Hsin Chen, Yi-Min Liu, Ming-Fang Tsai, Erh-Chan Yeh, Chih-Kuang Cheng, Yen-Po Wang, Nai-Fang Chi, I-Cheng Lee, Harn-Shen Chen, Yun-Cheng Hsieh, Yi-Chu Liao, Shao-Jung Hsu, Shuo-Ming Ou, Kuan-Lin Lai, Chung-Chi Lin, Yi-Jen Chen, Chia-Ming Chang, Peng-Hui Wang, Yung-Hung Luo, Yun-Ting Chang, Chih-Chiang Chen, Yu-Cheng Hsieh, Yi-Ming Chen, Tzu-Hung Hsiao, Ching‐Heng Lin, Yen-Ju Chen, I-Chieh Chen, Chien-Lin Mao, Shu-Jung Chang, Yen-Lin Chang, Yi‐Ju Liao, Chih-Hung Lai, Wei-Ju Lee, Hsin Tung, Ting-Ting Yen, Hsin-Chien Yen, Shy-Shin Chang, Yu-Sheng Chang, Ting I Lee, Shauh-Der Yeh, Mei-Yi Wu, Ming-Shun Wu, Lung Wen Tsai, Cai-mei Zheng, Yu-Mei Chien, Tsung-Hsien Lin, Yen-Hsu Chen, Cheng-Che E. Lan, Jeng-Hsien Yen, Wen-Chen Liang, Te-Fu Chan, Shyh-Shin Chiou, Shih-Chang Chuang, Shang-Jyh Hwang, Yi-Jung Lin, Yu-Chuang Huang, Wan-Ru Li, Tsai-Chuan Chen, Wei-Ting Huang, Kuan-Chih Chen, Shin-Yee Lim, Yi-Shiuan Shen, Chia-Chia Huang, Chien-Hung Chen, Ya-Chung Tian, Chia-Ling Chen, Yao-Fan Fang, Ji-Tseng Fang, Yi-Hao Yen, Wei-Chi Wu, Wen-Shih Huang, Chi-Chin Sun, Mei-Jyh Chen, Ching-Hung Lin, Tsung-Hua Yang, Pei-Lin Lee, Ming-Yang Wang, Tsen-Fang Tsai, Tung-Hung Su, Jyh-Ming Liou, Shun-Fa Yang, Chia-Chuan Hsieh, Chih-Chien Sung, Feng-Chih Kuo, Shih-Hua Lin, Dueng-Yuan Hueng, Chien-Jung Lin, Hueng-Yuan Shen, Chang-Hsun Hsieh, Shinn-Zong Lin, Tso-Fu Wang, Tsung-Jung Ho, Pei-Wei Shueng, Chen-Hsi Hsieh, Kuo-Shyang Jeng, Gwo-Chin Ma, Ting-Yu Chang, Han-Sun Chiang, Yi-Tien Lin, Kuo-Jang Kao, Chen-Fang Hung, I-Mo Fang, Po-Yueh Chen, Kochung Tsui, Wei-Jen Yao, Shiou-Sheng Chen, Ming Chen, Chih-Yang Huang, Da-Wei Wang, Chun-houh Chen, Yen-Tsung Huang
October 2024, Springer Science + Business Media
DOI: 10.21203/rs.3.rs-5262120/v1