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This page is a summary of: Messstrategien für die zerstörungsfreie Schichtmessung mittels Ultraschallmikroskopie Strategies for the Non-Destructive Characterization of Thin Layers with Scanning Acoustic Microscopy, tm - Technisches Messen, January 2008, De Gruyter,
DOI: 10.1524/teme.2008.0838.
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