Publication
Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation
E Jan W ter Maten, Piotr A Putek, Michael Günther, Roland Pulch, Caren Tischendorf, Christian Strohm, Wim Schoenmaker, Peter Meuris, Bart De Smedt, Peter Benner, Lihong Feng, Nicodemus Banagaaya, Yao Yue, Rick Janssen, Jos J Dohmen, Bratislav Tasić, Frederik Deleu, Renaud Gillon, Aarnout Wieers, Hans-Georg Brachtendorf, Kai Bittner, Tomáš Kratochvíl, Jiří Petřzela, Roman Sotner, Tomáš Götthans, Jiří Dřínovský, Sebastian Schöps, David J Duque Guerra, Thorben Casper, Herbert De Gersem, Ulrich Römer, Pascal Reynier, Patrice Barroul, Denis Masliah, Benoît Rousseau
Journal of Mathematics in Industry, June 2016, Springer Science + Business Media
DOI: 10.1186/s13362-016-0025-5