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This page is a summary of: Comparative Study of Biaxial and Uniaxial Mechanical Stress Influence on the Low Frequency Noise of Fully Depleted SOI nMOSFETs Operating in Triode and Saturation Regime, ECS Transactions, August 2012, The Electrochemical Society,
DOI: 10.1149/04901.0077ecst.
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