Optical and NLO properties of chalocgenide thin films

What is it about?

We demonstrate the fabrication and nonlinear optical (NLO) characterization of chalcogenide glass thin ¯lms obtained from the solution phase driven approach. The characterization of the ¯lms was ahieved using FESEM, AFM, micro-Raman, FTIR, UV-Visible spectroscopy, optical pro¯lometry and XRD. The NLO studies were performed on the solution driven and thermally deposited As2S3 ¯lms with
2 ps, 800nm laser pulses using the Z-scan technique. The results obtained from AFM measurements demonstrated that the surface roughness of the ¯lm was considerably low (
2 nm) and Z-scan data indicated that the nonlinear refractive index was in the 1.0–11:0  1018 m2/W range.

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Why is it important?

Chalcogenide glasses/films are important for photonic applications