Publication
System and process learning in a full-field, high-power EUVL alpha tool
William P. Ballard, Daniel A. Tichenor, Donna J. O'Connell, Luis J. Bernardez II, Robert E. Lafon, Richard J. M. Anderson, Alvin H. Leung, Kenneth A. Williams, Steven J. Haney, Yon E. Perras, Karen L. Jefferson, Therese L. Porter, Daniel Knight, Pamela K. Barr, James L. Van de Vreugde, Richard H. Campiotti, Mark D. Zimmerman, Terry A. Johnson, Leonard E. Klebanoff, Philip A. Grunow, Samuel Graham, Jr., Dean A. Buchenauer, William C. Replogle, Tony G. Smith, John B. Wronosky, Joel R. Darnold, Kenneth L. Blaedel, Henry N. Chapman, John S. Taylor, Layton C. Hale, Gary E. Sommargren, Eric M. Gullikson, Patrick P. Naulleau, Kenneth A. Goldberg, Sang Hun Lee, Harry Shields, Randall J. St. Pierre, Samuel Ponti
June 2003, SPIE
DOI: 10.1117/12.482791