Publication
Lithographic evaluation of the EUV engineering test stand
Sang Hun Lee, Daniel A. Tichenor, William P. Ballard, Luis J. Bernardez II, John E. M. Goldsmith, Steven J. Haney, Karen L. Jefferson, Terry A. Johnson, Alvin H. Leung, Donna J. O'Connell, William C. Replogle, John B. Wronosky, Kenneth L. Blaedel, Patrick P. Naulleau, Kenneth A. Goldberg, Eric M. Gullikson, Henry N. Chapman, Stefan Wurm, Eric M. Panning, Pei-yang Yan, Guojing Zhang, John E. Bjorkholm, Glenn D. Kubiak, Donald W. Sweeney, David T. Attwood, Jr., Charles W. Gwyn
July 2002, SPIE
DOI: 10.1117/12.472300