Publication
<title>System integration and performance of the EUV engineering test stand</title>
Daniel A. Tichenor, Avijit K. Ray-Chaudhuri, William C. Replogle, Richard H. Stulen, Glenn D. Kubiak, Paul D. Rockett, Leonard E. Klebanoff, Karen J. Jefferson, Alvin H. Leung, John B. Wronosky, Layton C. Hale, Henry N. Chapman, John S. Taylor, James A. Folta, Claude Montcalm, Regina Soufli, Eberhard A. Spiller, Kenneth L. Blaedel, Gary E. Sommargren, Donald W. Sweeney, Patrick P. Naulleau, Kenneth A. Goldberg, Eric M. Gullikson, Jeffrey Bokor, Phillip J. Batson, David T. Attwood, Jr., Keith H. Jackson, Scott D. Hector, Charles W. Gwyn, Pei-yang Yan
August 2001, SPIE
DOI: 10.1117/12.436665