Publication
Assessment of metal implant induced artefacts using photon counting spectral CT
Maya Rajeswari Amma, Maya Rajeswari Amma, Anthony Butler, Anthony Butler, Aamir Younus Raja, Aamir Younus Raja, Benjamin Bamford, Benjamin Bamford, Philip H. Butler, Philip H. Butler, Peter Walker, Peter Walker, Aysouda Matanaghi, Aysouda Matanaghi, Sikiru A. Adebileje, Sikiru A. Adebileje, Nigel Anderson, Nigel Anderson, Marzieh Anjomrouz, Marzieh Anjomrouz, Fatemeh Asghariomabad, Fatemeh Asghariomabad, Ali Atharifard, Ali Atharifard, Stephen T. Bell, Stephen T. Bell, Srinidhi Bheesette, Srinidhi Bheesette, Alexander I. Chernoglazov, Alexander I. Chernoglazov, Tara Dalefield, Tara Dalefield, Niels J. A. de Ruiter, Niels J. A. de Ruiter, Neryda Duncan, Neryda Duncan, Robert Doesburg, Robert Doesburg, Steven P. Gieseg, Steven P. Gieseg, Brian Goulter, Brian Goulter, Steven D. Alexander, Steven D. Alexander, Sam Gurney, Sam Gurney, Joseph Healy, Joseph Healy, Peter Hilton, Peter Hilton, Shishir Dahal, Shishir Dahal, Pierre Carbonez, Pierre Carbonez, Jérôme Damet, Jérôme Damet, Claire Chambers, Claire Chambers, Praveenkumar Kanithi, Praveenkumar Kanithi, Tracy Kirkbride, Tracy Kirkbride, Stuart Lansley, Stuart Lansley, Chiara Lowe, Chiara Lowe, V. B. H. Mandalika, V. B. H. Mandalika, Emmanuel Marfo, Emmanuel Marfo, Mahdieh Moghiseh, Mahdieh Moghiseh, David Palmer, David Palmer, Raj Panta, Raj Panta, Hannah Prebble, Hannah Prebble, Mohsen Ramyar, Mohsen Ramyar, Peter Renaud, Peter Renaud, Nanette Schleich, Nanette Schleich, Emily Searle, Emily Searle, Muhammed Shamshad, Muhammed Shamshad, Jereena Sheeja, Jereena Sheeja, Rayhan Uddin, Rayhan Uddin, Lieza Vanden Broeke, Lieza Vanden Broeke, Vivek V. S., Vivek V. S., Manoj Wijesooriya, Manoj Wijesooriya, Michael Walsh, Michael Walsh, Kenzie Baer, Kenzie Baer, Seamus Tredinnick, Seamus Tredinnick, Tim Woodfield, Tim Woodfield
September 2019, SPIE
DOI: 10.1117/12.2531003