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This page is a summary of: Robust dielectric properties of B-site size-disordered hexagonal Ln2CuTiO6 (Ln = Y, Dy, Ho, Er, and Yb), Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena, May 2014, American Vacuum Society,
DOI: 10.1116/1.4868112.
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