What is it about?
Making the best use of experimental data when determining 3D structures with X-ray crystallography requires a proper accounting for the effect of measurement errors. This new treatment overcomes problems with previous approximations used to deal with errors in photon counting in diffraction experiments.
Featured Image
Why is it important?
A recent trend in crystallography is to make use of weaker diffraction data, which highlights the shortcomings of existing error treatments.
Read the Original
This page is a summary of: A log-likelihood-gain intensity target for crystallographic phasing that accounts for experimental error, Acta Crystallographica Section D Structural Biology, March 2016, International Union of Crystallography,
DOI: 10.1107/s2059798315013236.
You can read the full text:
Contributors
The following have contributed to this page
