What is it about?
The proposed technique allows studying the morphology of thin films at a nanometer-scale and with element sensitivity. X-rays impinge the film surface at a grazing incidence and are scattered by the film. Performing such an experiment with X-rays at wavelengths near the absorption edge of a considered element allows determining the morphology of particles composed of this element.
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Why is it important?
Nowadays, a huge number of multi-component thin films are elaborated. A challenge is to elucidate the morphology of such nanomaterials. This X-ray technique allows determining the nanomorphology of different components in complex materials.
Perspectives
I hope this article will help people in studying the nanomorphology of components in complex thin films. This X-ray technique can be used to study thin films as a function of a parameter like the temperature (in situ experiment) or during operation (in operando experiment) in a large variety of fields like electronics, chemistry, energy applications.
Dr Christine Revenant
CEA
Read the Original
This page is a summary of: Anomalous grazing-incidence small-angle X-ray scattering of Ga2O3-based nanoparticles, Journal of Applied Crystallography, March 2018, International Union of Crystallography,
DOI: 10.1107/s1600576718001772.
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