What is it about?
Synchrotron light sources are key instruments of modern science, providing unique opportunities for groundbreaking studies in diverse scientific disciplines and driving innovation in numerous scientific and technological fields. Ultimate brightness of X-ray beams is the key to advancing to a smaller scale, faster response, and higher data measurement and processing rate. The brightness is primarily determined by the electron beam parameters at operational intensity. This article examines the brightness scaling with the electron beam energy and intensity to identify optimal combinations of the light source parameters.
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Why is it important?
High-brightness X-ray beams are demanded by numerous areas of scientific research, e.g. imaging the dynamics of materials on their relevant functional time and length scales, including studies on rechargeable Li-ion batteries, room- temperature crystallography of large molecules within sub-millisecond time scales and other advanced applications.
Perspectives
Writing this article was a great opportunity to share the recent experience for me and my co-authors with whom I work together for advancing synchrotron light sources.
Victor Smaluk
Brookhaven National Laboratory
Read the Original
This page is a summary of: Ultimate brightness of a medium-energy synchrotron light source at operational beam intensity, Journal of Synchrotron Radiation, April 2025, International Union of Crystallography,
DOI: 10.1107/s1600577525002723.
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