Graphene oxide derived high dielectric constant of polymer blends

What is it about?

In the present investigation, we have successfully fabricated and characterized modified Poly(methyl methacrylate) (PMMA)/Cellulose acetate (CA) nano blends as a function of graphene oxide (GO) loading. These nano blends were systematically characterized using x-ray diffraction (XRD), Fourier transforms infrared spectroscopy (FTIR), FT-Raman spectra, Ultraviolet and visible spectroscopic technique (UV–vis), Thermogravimetric analysis (TGA). The weak interfacial interaction between the polymer blend system and GO influenced on the mechanical stress-strain behavior of the polymer blend. Scanning electron microscopic (SEM) study reveals the entanglement of polymer network and existence of occupied GO network. Topographic two (2D) and three (3D)dimension micrographs recorded by Atomic force microscopy (AFM) technique estimate the decreased surface roughness due to the presence of carbon. Dielectric performances were carried out using impedance analyzer as a function of frequency (10 Hz to 1 MHz) and temperature (30°C–150 °C). The dielectric constant for the pure blend (ε' = 2.25) was appreciably improved to three fold (ε' = to 2.25 × 103) for 2 wt% GO loaded polymer blend system. The modified nano blends may be suitable for various electronic and electrical device applications.

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Why is it important?

In the present investigation, we have successfully fabricated and characterized modified Poly(methyl methacrylate) (PMMA)/Cellulose acetate (CA) nano blends as a function of graphene oxide (GO) loading. These nano blends were systematically characterized using x-ray diffraction (XRD), Fourier transforms infrared spectroscopy (FTIR), FT-Raman spectra, Ultraviolet and visible spectroscopic technique (UV–vis), Thermogravimetric analysis (TGA). The weak interfacial interaction between the polymer blend system and GO influenced on the mechanical stress-strain behavior of the polymer blend. Scanning electron microscopic (SEM) study reveals the entanglement of polymer network and existence of occupied GO network. Topographic two (2D) and three (3D)dimension micrographs recorded by Atomic force microscopy (AFM) technique estimate the decreased surface roughness due to the presence of carbon. Dielectric performances were carried out using impedance analyzer as a function of frequency (10 Hz to 1 MHz) and temperature (30°C–150 °C). The dielectric constant for the pure blend (ε' = 2.25) was appreciably improved to three fold (ε' = to 2.25 × 103) for 2 wt% GO loaded polymer blend system. The modified nano blends may be suitable for various electronic and electrical device applications.

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