What is it about?

We show that a single magneto-optical reflection experiment can precisely measure the magnetic properties of different layers in multilayer films. To do this, we created and studied a set of special samples, with one ferromagnetic layer, a non-magnetic layer, and a second ferromagnetic layer. These samples have a specific preferred magnetic direction and a controllable strength of the magnetic interaction between the ferromagnetic layers through the non-magnetic layer. Using a technique called generalized magneto-optical ellipsometry, we measured the angles of magnetization in the two ferromagnetic layers separately, depending on the applied magnetic field. We confirmed our findings with a model, which supported even the surprising aspects of our results and demonstrated the accuracy and reliability of our layer-specific magnetic measurements.

Featured Image

Why is it important?

This work represents a significant step forward in the precise measurement and understanding of magnetic properties in layered materials, opening up new possibilities for research and technological innovation

Read the Original

This page is a summary of: Layer-resolved vector magnetometry using generalized magneto-optical ellipsometry, Applied Physics Letters, July 2024, American Institute of Physics,
DOI: 10.1063/5.0209113.
You can read the full text:

Read

Contributors

The following have contributed to this page