What is it about?
A scanning x-ray microscope is a versatile tool that allows not only morphological observation but also analytical imaging of objects. This paper proposes a new method of image processing for raw micrographs composed of pixels that have a shape different from a beam footprint.
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Why is it important?
The proposed method can increase imaging performance in terms of resolution and throughput without any hardware upgrades.
Perspectives
I hope that the proposed method will contribute to a better understanding of various functional materials.
Hiroyuki Ohsumi
RIKEN
Read the Original
This page is a summary of: Post-acquisition upsampling method for scanning x-ray microscopy, Review of Scientific Instruments, March 2023, American Institute of Physics,
DOI: 10.1063/5.0098245.
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