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This article is about a study on a specific type of computer memory technology known as phase-change memory (PCM). The material used in this technology is called GST, an alloy made from germanium, antimony, and telluride. We are trying to understand how GST behaves under different conditions. We perform electrical characterization to measure how GST responds to changes in voltage and light. We found that GST is most sensitive to light at a temperature of 150 Kelvin (-123.15 Celsius or -189.67 Fahrenheit). We also discovered that there are barriers and wells (like hills and valleys) for electrons and holes (which are essentially missing electrons) at the boundary between the amorphous (disordered) and crystalline (ordered) parts of GST. These barriers and wells affect how electricity flows through the material. Lastly, we discuss a phenomenon called resistance drift, where the resistance of the GST changes over time. This is important because it can affect the reliability of the memory. We suggest that this drift might be due to the movement and relaxation of charges within the material.

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This page is a summary of: Electronic transport in amorphous Ge2Sb2Te5 phase-change memory line cells and its response to photoexcitation, Applied Physics Letters, June 2024, American Institute of Physics,
DOI: 10.1063/5.0196842.
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