All Stories

  1. Mist chemical vapor deposited-gate insulators for GaN-based MIS devices applications
  2. Evidence of reduced interface states in Al2O3/AlGaN MIS structures via insertion of ex situ regrown AlGaN layer
  3. Electrical properties of GaN-based MIS-HEMTs with Al2O3 gate insulator deposited by ALD and mist-CVD techniques
  4. Recessed gate GaN-based MIS-HEMTs with Al2O3 gate dielectric deposited by mist-CVD method
  5. Mist chemical vapor deposited-Al2O3/AlGaN interfacial characterization for GaN MIS-HEMTs
  6. Ornstein–Uhlenbeck process in a human body weight fluctuation
  7. Controlling surface/interface states in GaN-based transistors: Surface model, insulated gate, and surface passivation
  8. GaN-based MIS-HEMTs with Al2O3 dielectric deposited by low-cost and environmental-friendly mist-CVD technique
  9. Inverse integral transformation method to derive local viscosity distribution measured by optical tweezers
  10. Structural characterization of mist chemical vapor deposited amorphous aluminum oxide films using water-free solvent
  11. On the presence of Ga2O sub-oxide in high-pressure water vapor annealed AlGaN surface by combined XPS and first-principles methods
  12. Synthesis and characterization of mist chemical vapor deposited aluminum titanium oxide films
  13. Characterization of amorphous aluminium oxide thin films synthesized by mist-CVD
  14. Effect of Buffer Layer on Improvement of SnO2 Thin Film on Sapphire Substrate Formed by Mist Chemical Vapor Deposition
  15. Synthesis and characterization of AlTiO films by mist-CVD
  16. Improved linearity, stability, and thermal performance of multi-mesa-channel AlGaN/GaN HEMTs
  17. Structural characteristics of a non-polar ZnS layer on a ZnO buffer layer formed on a sapphire substrate by mist chemical vapor deposition
  18. State of the art on gate insulation and surface passivation for GaN-based power HEMTs
  19. Analytical derivation of charge relaxation time distribution in transistor from current noise spectrum using inverse integral transformation method
  20. Epitaxial Growth of Non-polar ZnS on Sapphire Substrate by Mist Chemical Vapor Deposition
  21. Influence of oxygen-plasma treatment on AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors with HfO2by atomic layer deposition: leakage current and density of states reduction
  22. Improvement of m -plane ZnO films formed on buffer layers on sapphire substrates by mist chemical vapor deposition
  23. On the origin of interface states at oxide/III-nitride heterojunction interfaces
  24. Single crystalline SnO2 thin films grown on m -plane sapphire substrate by mist chemical vapor deposition
  25. Highly-stable and low-state-density Al2O3/GaN interfaces using epitaxial n-GaN layers grown on free-standing GaN substrates
  26. Effects of Electronic States at Insulator/AlGaN Interfaces on Threshold Voltage Instability of Al2O3/AlGaN/GaN Structures
  27. Insulated gate and surface passivation structures for GaN-based power transistors
  28. Improvement of m-plane ZnO films formed on buffer layers on sapphire substrates by mist chemical vapor deposition
  29. SnO2 thin films grown on m-plane sapphire substrate by mist chemical vapor deposition
  30. Characterization of capture cross sections of interface states in dielectric/III-nitride heterojunction structures
  31. Formation of GaN porous structures with improved structural controllability by photoassisted electrochemical etching
  32. Impact of oxygen plasma treatment on the dynamic on-resistance of AlGaN/GaN high-electron-mobility transistors
  33. Bias-dependent Photoabsorption Properties of GaN Porous Structures under Back-side Illumination
  34. Large photocurrents in GaN porous structures with a redshift of the photoabsorption edge
  35. Formation of Self-aligned Pore Arrays on n-GaN Substrates by Photo-assisted Electrochemical Etching Process
  36. Current Collapse Reduction in AlGaN/GaN HEMTs by High-Pressure Water Vapor Annealing
  37. Formation of GaN-Porous Structures Using Photo-Assisted Electrochemical Process in Back-Side Illumination Mode
  38. Calculating relaxation time distribution function from power spectrum based on inverse integral transformation method
  39. Interface trap states in Al2O3/AlGaN/GaN structure induced by inductively coupled plasma etching of AlGaN surfaces
  40. Characterization of electronic states at insulator/(Al)GaN interfaces for improved insulated gate and surface passivation structures of GaN-based transistors
  41. Reduced thermal resistance in AlGaN/GaN multi-mesa-channel high electron mobility transistors
  42. Correlation between Structural and Photoelectrochemical Properties of GaN Porous Nanostructures Formed by Photo-Assisted Electrochemical Etching
  43. Interface Characterization and Control of GaN-based Heterostructures
  44. Characterization of interface states in Al2O3/AlGaN/GaN structures for improved performance of high-electron-mobility transistors
  45. Investigation on optical absorption properties of electrochemically formed porous InP using photoelectric conversion devices
  46. Formation and Photoelectrical Measurements of Pt Schottky Interfaces on InP Porous Structures
  47. Effects of Cl2-Based Inductively Coupled Plasma Etching of AlGaN on Interface Properties of Al2O3/AlGaN/GaN Heterostructures
  48. Interface characterization of Al2O3/AlGaN/GaN structure with inductively coupled plasma etching of AlGaN surface
  49. Characterization of Low-Frequency Noise in Etched GaAs Nanowire Field-Effect Transistors Having SiN$_{x}$ Gate Insulator
  50. Characterization of Low-Frequency Noise in Etched GaAs Nanowire Field-Effect Transistors Having SiNxGate Insulator
  51. Large photocurrent-response observed at Pt/InP Schottky interface formed on anodic porous structure
  52. Contraction behaviors of Vorticella sp. stalk investigated using high-speed video camera. I: Nucleation and growth model
  53. Contraction behaviors of Vorticella sp. stalk investigated using high-speed video camera. II: Viscosity effect of several types of polymer additives
  54. Optical Absorption Properties of InP Porous Structures Formed by Electrochemical Process
  55. Image analysis of thickness in flowing soap films. I: effects of polymer
  56. 3P215 Complex Chemical Physics XXXVIII : The lamellar - vesicle transition of Multilamellar Vesicle in sine oscillatory shear flow(Cell biology,The 48th Annual Meeting of the Biophysical Society of Japan)
  57. Size evolution of onion structure under oscillatory shear flow
  58. 2P-161 Study on Bio-Probe in Polymer Solutions(Cell biology,The 47th Annual Meeting of the Biophysical Society of Japan)
  59. 3P-145 Contraction process of Vorticella stalk measured by high-speed camera(Cell bioiogy,The 47th Annual Meeting of the Biophysical Society of Japan)
  60. 3P-147 Construction of game's relationship theory using five white-rot fungi(Cell bioiogy,The 47th Annual Meeting of the Biophysical Society of Japan)
  61. Formation process of shear-induced onion structure made of quaternary system SDS/octanol/water/NaCl
  62. Fluorescence lifetime imaging microscopy for in situ observation of the nanocrystallization of rubrene in a microfluidic set-up