All Stories

  1. Reliability modelling of CMOS image sensor

    Article • Chinese Journal of Aeronautics, September 2024, Tsinghua University Press

    Xiaoyang Li

  2. A time-varying copula-based prognostics method for bivariate accelerated degradation testing

    Article • Journal of Intelligent & Fuzzy Systems, June 2018, IOS Press

    Xiaoyang Li

  3. Integration method for reliability assessment with multi-source incomplete accelerated degradation testing data

    Article • Quality Engineering, March 2017, Taylor & Francis

    Xiaoyang Li

  4. Utilizing Accelerated Degradation and Field Data for Life Prediction of Highly Reliable Products

    Article • Quality and Reliability Engineering International, December 2015, Wiley

    Xiaoyang Li