All Stories

  1. Technology for non-destructive inspection of SiC wafers

    Article • Journal of Applied Crystallography, July 2022, International Union of Crystallography

    Shunta Harada

  2. Suppression of Polytype Transformation with Extremely Low-Dislocation-Density 4H-SiC Crystal in Two-Step Solution Method

    Article • Materials Science Forum, June 2018, Trans Tech Publications

    Shunta Harada

  3. Dislocation Behavior in Bulk Crystals Grown by TSSG Method

    Article • Materials Science Forum, June 2018, Trans Tech Publications

    Shunta Harada