All Stories

  1. Vibrational spectroscopy in the electron microscope

    Article • Nature, October 2014, Springer Science + Business Media

    Professor Ray F Egerton

  2. Charging of Thin Film Phase Plates under Electron Beam Irradiation

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Professor Ray F Egerton

  3. Electron Diffraction Based Tilt Angle Measurements in Electron Tomography

    Article • Microscopy and Microanalysis, August 2014, Oxford University Press (OUP)

    Professor Ray F Egerton

  4. Angle-resolved Valence EELS of a Single Crystal Gold Sample

    Article • Microscopy and Microanalysis, August 2014, Cambridge University Press

    Professor Ray F Egerton

  5. Accurate measurement of relative tilt and azimuth angles in electron tomography: A comparison of fiducial marker method with electron diffraction

    Article • Review of Scientific Instruments, August 2014, American Institute of Physics

    Professor Ray F Egerton

  6. Ethics issues

    Article • Micron, June 2014, Elsevier

    Professor Ray F Egerton

  7. TEM-EELS now has the ability to characterize chemical bonds

    Article • Microscopy and Microanalysis, February 2014, Oxford University Press (OUP)

    Professor Ray F Egerton

  8. Momentum-resolved Electron Energy Loss Spectroscopy (q-EELS) for Quantum Plasmonics and Metamaterials

    Article • January 2014, Optical Society of America (OSA)

    Professor Ray F Egerton

  9. Electron irradiation damage and color centers of MgO nanocube

    Article • Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, December 2013, Elsevier

    Professor Ray F Egerton

  10. TEM results on beam-sensitive specimens should include details of beam current, recording time etc.

    Article • Microscopy Today, November 2013, Oxford University Press (OUP)

    Professor Ray F Egerton

  11. Beam-Induced Motion of Adatoms in the Transmission Electron Microscope

    Article • Microscopy and Microanalysis, February 2013, Oxford University Press (OUP)

    Professor Ray F Egerton

  12. Convenient contrast enhancement by a hole-free phase plate

    Article • Ultramicroscopy, July 2012, Elsevier

    Professor Ray F Egerton

  13. Local thickness measurement through scattering contrast and electron energy-loss spectroscopy

    Article • Micron, January 2012, Elsevier

    Professor Ray F Egerton

  14. Water-Soluble J-Type Rosette Nanotubes with Giant Molar Ellipticity

    Article • Journal of the American Chemical Society, October 2010, American Chemical Society (ACS)

    Professor Ray F Egerton, Professor Hicham Fenniri

  15. Advances in the Transmission Electron Microscopy of Polymers

    Article • Polymer Reviews, July 2010, Taylor & Francis

    Professor Ray F Egerton

  16. A plea to researchers to publish in scientifically relevant journals

    Article • Microscopy Today, January 2010, Oxford University Press (OUP)

    Professor Ray F Egerton

  17. Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)

    Article • Ultramicroscopy, September 2009, Elsevier

    Professor Ray F Egerton

  18. Heteroepitaxial Growth of Gold Nanostructures on Silicon by Galvanic Displacement

    Article • ACS Nano, August 2009, American Chemical Society (ACS)

    Professor Ray F Egerton

  19. Low-dose performance of parallel-beam nanodiffraction

    Article • Ultramicroscopy, December 2008, Elsevier

    Professor Ray F Egerton

  20. The spatial resolution of electron energy loss and x-ray absorption fine structure

    Article • Journal of Applied Physics, August 2008, American Institute of Physics

    Professor Ray F Egerton

  21. Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates

    Article • Ultramicroscopy, January 2008, Elsevier

    Professor Ray F Egerton

  22. Valence state map of iron oxide thin film obtained from electron spectroscopy imaging series

    Article • Micron, June 2007, Elsevier

    Professor Juhn-Jong Lin, Professor Ray F Egerton

  23. Alternative methods of identifying the oxidation of metallic nanoparticles embedded in a matrix

    Article • Micron, June 2007, Elsevier

    Professor Ray F Egerton

  24. Multilayer route to iron nanoparticle formation in an insulating matrix

    Article • Journal of Applied Physics, February 2007, American Institute of Physics

    Professor Ray F Egerton

  25. Bright-field TEM imaging of single molecules: Dream or near future?

    Article • Ultramicroscopy, January 2007, Elsevier

    Professor Ray F Egerton

  26. Interpretation of the postpeak in iron fluorides and oxides

    Article • Ultramicroscopy, August 2006, Elsevier

    Professor Ray F Egerton

  27. Improving the energy resolution of X-ray and electron energy-loss spectra

    Article • Micron, June 2006, Elsevier

    Professor Ray F Egerton

  28. Energy-loss near-edge fine structures of iron nanoparticles

    Article • Micron, June 2006, Elsevier

    Professor Ray F Egerton

  29. Quantitative Dose-damage Relationships for Radiation Damage to Polymers and Molecular Compounds in X-ray and Electron Microscopes

    Article • Microscopy and Microanalysis, August 2005, Oxford University Press (OUP)

    Professor Ray F Egerton

  30. Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology

    Article • Journal of Applied Physics, August 2005, American Institute of Physics

    Professor Ray F Egerton

  31. Physical Principles of Electron Microscopy

    Article • January 2005, Springer Science + Business Media

    Professor Ray F Egerton

  32. Recent Developments

    Article • January 2005, Springer Science + Business Media

    Professor Ray F Egerton

  33. Electron Optics

    Article • January 2005, Springer Science + Business Media

    Professor Ray F Egerton

  34. TEM Specimens and Images

    Article • January 2005, Springer Science + Business Media

    Professor Ray F Egerton

  35. An Introduction to Microscopy

    Article • January 2005, Springer Science + Business Media

    Professor Ray F Egerton

  36. Analytical Electron Microscopy

    Article • January 2005, Springer Science + Business Media

    Professor Ray F Egerton

  37. The Transmission Electron Microscope

    Article • January 2005, Springer Science + Business Media

    Professor Ray F Egerton

  38. The Scanning Electron Microscope

    Article • January 2005, Springer Science + Business Media

    Professor Ray F Egerton

  39. Electron-beam patterning with sub-2 nm line edge roughness

    Article • Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena, January 2005, American Vacuum Society

    Professor Ray F Egerton

  40. Fast photoresponse in organic semiconductors: understanding the mechanisms and structure-property relationships

    Article • October 2004, SPIE

    Professor Ray F Egerton

  41. High-energy electron diffraction and microscopy

    Article • Micron, October 2004, Elsevier

    Professor Ray F Egerton

  42. Experimental Techniques and Instrumentation

    Article • September 2004, Wiley

    Professor Ray F Egerton

  43. The Lateral Range and Energy Deposition of Fast Secondary Electrons

    Article • Microscopy and Microanalysis, August 2004, Oxford University Press (OUP)

    Professor Ray F Egerton

  44. Exposure characteristics of cobalt fluoride (CoF2) self-developing electron-beam resist on sub-100 nm scale

    Article • Journal of Applied Physics, July 2002, American Institute of Physics

    Professor Ray F Egerton

  45. Transmission Electron Microscopy and Diffractometry of Materials

    Article • Micron, January 2002, Elsevier

    Professor Ray F Egerton

  46. Observations of the microscopic growth mechanism of pillars and helices formed by glancing-angle thin-film deposition

    Article • Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, January 2001, American Vacuum Society

    Professor Ray F Egerton

  47. Thin-film regular-array structures with 10-100 nm repeat distance

    Article • Nanotechnology, November 2000, Institute of Physics Publishing

    Professor Ray F Egerton

  48. Calibration Specimens for Determining Energy-Dispersive X-ray k-Factors of Boron, Nitrogen, Oxygen, and Fluorine

    Article • Microscopy and Microanalysis, January 1999, Oxford University Press (OUP)

    Professor Ray F Egerton

  49. Electron Energy‐Loss Spectroscopy in the Electron Microscope

    Article • Journal of Microscopy, January 1997, Wiley

    Professor Ray F Egerton

  50. Electron Energy-Loss Spectroscopy in the Electron Microscope

    Article • January 1995, Springer Science + Business Media

    Professor Ray F Egerton

  51. Quantitative Electron Energy-Loss Spectroscopy

    Article • January 1995, Springer Science + Business Media

    Professor Ray F Egerton

  52. Electron Energy-Loss Spectroscopy in the Electron Microscope

    Article • Physics Today, November 1987, American Institute of Physics

    Professor Ray F Egerton

  53. Instrumentation for Energy-Loss Spectroscopy

    Article • January 1986, Springer Science + Business Media

    Professor Ray F Egerton

  54. Applications of Energy-Loss Spectroscopy

    Article • January 1986, Springer Science + Business Media

    Professor Ray F Egerton

  55. Electron Scattering Theory

    Article • January 1986, Springer Science + Business Media

    Professor Ray F Egerton

  56. Quantitative Analysis of the Energy-Loss Spectrum

    Article • January 1986, Springer Science + Business Media

    Professor Ray F Egerton

  57. An Introduction to Electron Energy-Loss Spectroscopy

    Article • January 1986, Springer Science + Business Media

    Professor Ray F Egerton