All Stories

  1. Effect of carbon coating on surface structure in annealing process of high-dose implanted/annealed SiC
  2. 3D structure of threading screw dislocation at a deep location in 4H-SiC using 3D micro-X-ray topography
  3. Three-dimensional micro-X-ray topography using focused sheet-shaped X-ray beam
  4. Thermally Stable and Radiation‐Proof Visible‐Light Photodetectors Made from N‐Doped Diamond
  5. Development of High-Resolution Nuclear Emulsion Plates for Synchrotron X-Ray Topography Observation of Large-Size Semiconductor Wafers
  6. Defect generation behavior in Czochralski-grown ScAlMgO4 crystal using synchrotron X-ray topography
  7. Expansion of beam width in exposure and crystal structure beamline (BL09) of SAGA-LS and applications using expanded beams
  8. Nucleation sites of expanded stacking faults detected by in operando x-ray topography analysis to design epitaxial layers for bipolar-degradation-free SiC MOSFETs
  9. Observation of defect structure in ScAlMgO4 crystal using X-ray topography
  10. Characterization of Defect Structure in Epilayer Grown on On-Axis SiC by Synchrotron X-ray Topography
  11. Advanced X-ray imaging at beamline 07 of the SAGA Light Source
  12. In-operando x-ray topography analysis of SiC metal–oxide–semiconductor field-effect transistors to visualize stacking fault expansion motions dynamically during operations
  13. Correlation between crystal warpage and swelling of 4H-SiC through implantation and annealing
  14. Resistivity Measurement of P<sup>+</sup>-Implanted 4H-SiC Samples Prepared at Different Implantation and Annealing Temperatures Using Terahertz Time-Domain Spectroscopic Ellipsometry
  15. Induction of flower-colour mutation by synchrotron-light irradiation in spray chrysanthemum
  16. Determination of observable depth of dislocations in 4H-SiC by X-ray topography in back reflection
  17. Warpage Structure of 4H-SiC after Implantation and Annealing Processes
  18. Observation of channeling effects for relativistic electrons in a polycrystal
  19. Influence of P<sup>+</sup>-Implantation and Post-Annealing on Warpage Structure of 4H-SiC Wafers
  20. Appearance of local strain fields and high electrical conductivity of macro-defects in P+-implanted 4H-SiC
  21. Development of diffraction enhanced imaging at beamline BL07 at the SAGA Light Source and its application
  22. Enhancement of dielectric constant of BaTiO3nanoparticles studied by resonant x-ray emission spectroscopy
  23. Development of white and monochromatic X‐ray topography system in SAGA‐LS
  24. Structural change of micropipes in Al-implanted SiC crystals by post-implantation annealing
  25. X-ray Spectroscopic Study on Photoluminescence Properties of Red Phosphor SrTiO3:Pr3+,Al
  26. Observation of the Fixed Fe–CN–Mn Cluster in Cesium Manganese Hexacyanoferrate
  27. A UV-induced one-dimensional motion of titanium ions in perovskite titanates
  28. Luminescence mechanism of (Pr, Al)-dopedSrTiO3fine particles inv...
  29. Observation of phase transition of cesium manganese hexacyanoferrates by X-ray absorption spectroscopy
  30. Magnetic polarization of Cu layers in exchange-coupledCo∕Cu
  31. Observation of x-ray magnetic circular dichroism at theRuKedge in
  32. Interface Structures and Magnetic Properties of Exchanged-Coupled Co/Cu Multilayers Sputter-Grown on Ta Buffers
  33. Growth process and nanostructure of crystalline GaAs on Si(1 1 0) surface prepared by molecular beam epitaxy
  34. Probing the Magnetic Polarizations of Delocalized Electrons in Exchange-coupled Co/CuNi Multilayers by X-ray Magnetic Circular Dichroism Measurements
  35. Measurement and multiple-scattering calculation of CuK-edge x-ray magnetic circular dichroism spectra from an exchange-coupled
  36. Structures of submonatomic Sn layers in Fe/Cr(Sn)Cr magnetic multilayers determined by anomalous x-ray scattering measurements