All Stories

  1. Why FETs detect a THz signal at a frequency far beyond their amplifying capabilities
  2. Thermoemission-Based Model of THz Detection and Its Validation—JLFET Case Studies
  3. A new method for characterization of gate overlap capacitances and effective channel size in MOSFETs
  4. FOSS EKV2.6 Verilog-A Compact MOSFET Model
  5. New design of the cantilevers for radiation pressure investigations
  6. THz detectors based on Si-CMOS technology field effect transistors – advantages, limitations and perspectives for THz imaging and spectroscopy
  7. Application of High-Resistivity Silicon Substrate for Fabrication of MOSFET-Based THz Radiation Detectors
  8. Cascode Enhanced Junctionless Field Effect Transistor THz Detector
  9. Field Effect Transistors Based Terahertz Detectors 25 Years History, State of the Art and Future Directions
  10. An Effect of Device Topology in VeSTIC Process on Logic Circuit Operation A Study Based on Ring Oscillator Operation Analysis
  11. A test structure for characteriation of the shallow piezoresistor-based strain sensors
  12. Detection of THz radiation by SOI sensors influence of doping and polarization on output signal
  13. Electrical characterization of different types of transistors fabricated in VeSTIC process
  14. FDSOI MOSFET threshold voltage characterization based on AC simulation and measurements
  15. MOSFETs in the VeSTIC process - fabrication and characterization
  16. Elimination of the channel current effect on the characterization of MOSFET threshold voltage using junction capacitance measurements
  17. A test structure for investigation of junctionless FETs as THz radiation sensors
  18. Bipolar transistor in VESTIC technology: prototype
  19. An Influence of Silicon Substrate Parameters on a Responsivity of MOSFET-Based Terahertz Detectors
  20. FET based THz detector with integrated antenna and source follower
  21. FOSS as an efficient tool for extraction of MOSFET compact model parameters
  22. Development and Modeling of Thermal Energy Harvesting Setup
  23. A method for combined characterization of MOSFET threshold voltage and junction capacitance eliminating channel current effect
  24. Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy
  25. Specialized MEMS microphone for industrial application
  26. Silicon junctionless field effect transistors as room temperature terahertz detectors
  27. Simple methods of threshold voltage parameter extraction for MOSFET models
  28. Qucs-based development of an energy harvester compact model
  29. FOSS EKV 2.6 parameter extractor
  30. A simple method for characterization of MOSFET serial resistance asymmetry
  31. Thermal energy harvesters with piezoelectric or electrostatic transducer
  32. A simple multi-purpose method for compact model evaluation
  33. Fabrication and characterization of junctionless MOSFETs for sensor applications
  34. CMOS Readout Circuit Integrated with Ionizing Radiation Detectors
  35. SOI-Based Microsensors
  36. Adjustment of sensivity of ISFET-type micro- and nanosensors
  37. On-wafer measurements and characterization of poly-si resistors for evaluation of selected CMOS manufacturing processes
  38. From FinFET to nanowire ISFET
  39. Compact/SPICE Modeling
  40. Development of Si Nanowire Chemical Sensors
  41. Terahertz Photovoltaic Response of Si-MOSFETs: Spin Related Effect
  42. Non-Standard FinFET Devices for Small Volume Sample Sensors
  43. Development and characterisation of nanowire-based FETs
  44. Transcutaneous Blood Capnometry Sensor Head Based on a Back-Side Contacted ISFET
  45. Spin related effect in Terahertz photovoltaic response of Si-MOSFETs
  46. Double-fin FETs based on standard CMOS approach
  47. Investigation of the S-PIN Diodes for Silicon Monolithic Antennas With Reconfigurable Aperture
  48. Simulation of electrical parameters of new design of SLHC silicon sensors for large radii
  49. Development of a Monolithic Active Pixel Sensor Using SOI Technology With a Thick Device Layer
  50. Fabrication and characterisation of high resistivity SOI substrates for monolithic high energy physics detectors
  51. Development of Monolithic Active Pixel Sensor in SOI Technology fabricated on the wafer with thick device layer
  52. Development of MPW Service for Academies Based on ITE Proprietary CMOS Process
  53. Fabrication of MOS - Compatible Ion - Sensitive Devices for Water Pollution Monitoring (Warmer)
  54. Full-size monolithic active pixel sensors in SOI technology—Design considerations, simulations and measurements results
  55. The SUCIMA project: A status report on high granularity dosimetry and proton beam monitoring
  56. Prototypes of large-scale SOI monolithic active pixel sensors
  57. Technology development for SOI monolithic pixel detectors
  58. Silicon Ultra fast Cameras for electron and γ sources In Medical Applications: a progress report
  59. Monolithic silicon pixel detectors in SOI technology
  60. Monolithic active pixel sensor realized in SOI technology—concept and verification
  61. Application of ion implantation for mono-Si piezoresistors manufacturing in silicon MEMS technology
  62. Monolithic active pixel detector realized in silicon on insulator technology
  63. SILICON PAD DETECTORS FOR AN ELECTROMAGNETIC CALORIMETER AT FUTURE LINEAR COLLIDER EXPERIMENTS: CHARACTERISATION AND TEST BEAM RESULTS
  64. SOI active pixel detectors of ionizing radiation-technology and design development
  65. Position-sensitive silicon detectors for real-time dosimetry in medical applications
  66. Hybrid active pixel sensors and SOI inspired option
  67. SUCIMA - Silicon Ultra fast Cameras for electron and gamma sources in Medical Applications
  68. Charge sharing modeling in pixel detectors with capacitive charge division
  69. DC and AC Models of Partially-Depleted SOI MOSFETs in Weak Inversion
  70. An efficient approach to the measurement and characterization of MOSFET capacitances
  71. Influence of Silicon Film Parameters on C-V Characteristics of Partially Depleted SOI MOSFETs.
  72. Optimized Diode Analysis of Electrical Silicon Substrate Properties
  73. Improved Extraction of Si Substrate Parameters from Combined I-V and C-V Measurements on P-N Junction Diodes
  74. Design, Fabrication and Characterization of SOI Pixel Detectors of Ionizing Radiation
  75. Fully depleted monolithic active pixel sensor in SOI technology