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  1. Negative Bias Temperature Instability of SiC MOSFET

    Article • Materials Science Forum, May 2016, Trans Tech Publications

    Chwan Ying Lee

  2. Effect of Fixed Oxide Charges and Donor-Like Interface Traps on the Breakdown Voltage of SiC Devices with FGR and JTE Terminations

    Article • Materials Science Forum, June 2015, Trans Tech Publications

    Chwan Ying Lee