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  1. A Hysteresis Compensation Algorithm for the Generation of Nonlinear Voltage Sweep for IV-Characteristic Measurement of High-Capacitance Solar Modules With Xenon Flasher
  2. Optical permittivity model for polycrystalline semiconductors
  3. In situ spectroscopic ellipsometry as a pathway toward achieving VO2 stoichiometry for amorphous vanadium oxide with magnetron sputtering