All Stories

  1. Apparatus for Seebeck coefficient measurement of wire, thin film, and bulk materials in the wide temperature range (80–650 K)

    Article • Review of Scientific Instruments, October 2019, American Institute of Physics

    Dr Asokan Kandasami, Ashish Kumar, Saurabh Singh

  2. microstructural (XTEM) analyses of 200MeV Ag ion irradiated Ni/GaN Schottky barrier diode

    Article • Applied Physics Letters, October 2012, American Institute of Physics

    Ashish Kumar