All Stories

  1. Conducting carbon films with covalent binding sites for biomolecule attachment
  2. Electroless Nickel Deposition: An Alternative for Graphene Contacting
  3. Chemically specific identification of carbon in XPS imaging using Multivariate Auger Feature Imaging (MAFI)
  4. Removing Beam Current Artifacts in Helium Ion Microscopy: A Comparison of Image Processing Techniques
  5. Gas cluster ion beam for the characterization of organic materials in submarine basalts as Mars analogs
  6. In situion beam sputter deposition and X-ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis
  7. Multispectral optical imaging combinedin situwith XPS or ToFSIMS and principal component analysis
  8. Rapid multivariate analysis of 3D ToF-SIMS data: graphical processor units (GPUs) and low-discrepancy subsampling for large-scale principal component analysis
  9. Optimal conditions for gas cluster ion beams in studying inorganic interface species: improved chemical information at a ZnO interface
  10. Investigations of the polymer/magnetic interface of organic spin-valves
  11. Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method
  12. Multivariate Auger Feature Imaging (MAFI) - a new approach towards chemical state identification of novel carbons in XPS imaging
  13. Observed damage during Argon gas cluster depth profiles of compound semiconductors
  14. Optimizing the Vacuum Growth of Epitaxial Graphene on 6H-SiC
  15. Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications
  16. Stability of reference masses: VII. Cleaning methods in air and vacuum applied to a platinum mass standard similar to the international and national kilogram prototypes
  17. Stability of reference masses: VI. Mercury and carbonaceous contamination on platinum weights manufactured at a similar time as the international and national prototype kilograms
  18. Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry
  19. X-ray enhanced sputter rates in argon cluster ion sputter-depth profiling of polymers
  20. Comparison of carbon nanotube modified electrodes for photovoltaic devices
  21. Langmuir probe characterization of low-frequency oscillations in a radio-frequency SF 6 plasma
  22. Raman Characterisation of Carbon Nanotubes Grown by Plasma Enhanced Chemical Vapour Deposition
  23. Transition from single to multi-walled carbon nanotubes grown by inductively coupled plasma enhanced chemical vapor deposition
  24. Radio frequency SF6 plasma modified single-walled carbon nanotubes: Synchrotron spectroscopy and plasma characterisation studies
  25. Synchrotron Soft X‐ray Studies of Single‐Walled Carbon Nanotubes Functionalized by Radio‐Frequency SF6 Plasma
  26. RF plasma functionalized carbon surfaces for supporting sensor architectures
  27. Plasma modified carbon surfaces for supporting sensor architectures
  28. Plasma Fluorination of Highly Ordered Pyrolytic Graphite and Single Walled Carbon Nanotube Surfaces