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  1. On Transistor Sizing of CMOS 6T-SRAM for NBTI-aware Design

    Article • IET Circuits Devices & Systems, February 2020, the Institution of Engineering and Technology (the IET)

    Pr Hamid Bentarzi, Dr. Boualem Djezzar, Amel Chenouf, Impact of Dimensions of Memory Periphery FinFETs on Bias Temperature Instability Boualem Djezzar